ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,820, issued on Oct. 20, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Electron gun and electron microscope" was invented by Hideo Moris... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,821, issued on Oct. 20, was assigned to NuFlare Technology Inc. (Yokohama, Japan) and NuFlare Technology America Inc. (Sunnyvale, Calif.). ... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,822, issued on Oct. 20, was assigned to FEI Co. "Aberration correction in charged particle spectroscopy" was invented by Alexander Henstra ... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,823, issued on Oct. 20, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany). "Ablating material for an object in a particle beam dev... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,824, issued on Oct. 20, was assigned to Axcelis Technologies Inc. (Beverly, Mass.). "Tuning apparatus for minimum divergence ion beam" was ... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,825, issued on Oct. 20, was assigned to Tokyo Electron Ltd. (Tokyo). "Plasma processing apparatus" was invented by Yasuaki Taniike (Nirasak... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,826, issued on Oct. 20, was assigned to Tokyo Electron Ltd. (Tokyo). "Plasma control method, plasma processing apparatus and plasma process... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,827, issued on Oct. 20, was assigned to KOREA INSTITUTE OF FUSION ENERGY (Daejeon, South Korea). "Electrode for capacitively coupled plasma... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,828, issued on Oct. 20, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Multi-electrode source assembly for plasma processin... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,829, issued on Oct. 20, was assigned to Lam Research Corp. (Fremont, Calif.). "Systems and methods for extracting process control informati... Read More